Home Subscription Services

Quintessence International
QI Home Page
About the Editor
Editorial Board
Accepted Manuscripts
Author Guidelines
Submission Form
Reprints / Articles
Quintessence Publishing: Journals: QI
Quintessence International

Edited by Eli Eliav

ISSN 0033-6572 (print) • ISSN 1936-7163 (online)

May 1994
Volume 25 , Issue 5

Share Abstract:

Silica contamination of etched dentin and enamel surfaces: A scanning electron microscopic and bond strength study

Perdigao/Denehy/Swift, Jr

Pages: 327-333
PMID: 7938417

Most acid-etchant gels are thickened with silica, which can leave a particulate residue on dentinal surfaces. Some newer etchants are thickened with polymers, which reportedly leave no surface residue. This study used scanning electron microscopy to examine dentinal and enamel surfaces that had been etched with either silica- or polymer-thickened gels. The silica gels left particulate debris on dentinal surfaces, and this debris was not removed by rinsing with water. There was little evidence of this contaminant on enamel surfaces. Enamel and dentinal surfaces treated with the polymer-thickened gels appeared to be clean and uncontaminated. Shear bond strengths of composite resin to enamel and dentin etched with the different types of gel etchants were also evaluated. Silica contamination did not adversely affect bonding. in fact, etching with silica-thickned gels resulted in slightly higher bond strengths to both substrates. However, the differences were not statistically significant.

Full Text PDF File | Order Article


Get Adobe Reader
Adobe Acrobat Reader is required to view PDF files. This is a free program available from the Adobe web site.
Follow the download directions on the Adobe web site to get your copy of Adobe Acrobat Reader.
  © 2020 Quintessence Publishing Co Inc

Home | Subscription Services | Books | Journals | Multimedia | Events | Blog
Terms of Use | Privacy Policy | About Us | Contact Us | Advertising | Help | Sitemap | Catalog